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Titlebook: Electron Microbeam Analysis; Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera

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41#
發(fā)表于 2025-3-28 16:10:31 | 只看該作者
Calculation of Depth Distribution Functions for Characteristic and for Continuous Radiation,n 5% when compared with those given by the model of Pouchou and Pichoir. The calculation of depth distribution curves for continuous radiation reveals that the differences between characteristic and continuous curves are larger than commonly expected. These differences depend on the overvoltage and on the atomic number.
42#
發(fā)表于 2025-3-28 22:27:32 | 只看該作者
Automatic Analysis of Soft X-Ray Emission Spectra Obtained by EPMA,the SRIP-method is applied in the iterative procedure until convergence is attained. While observing the residuals, the next peak is added to the previous model and the procedure continues. The results are illustrated by examples of oxygen soft X-ray emission spectra deconvolution for periclase, korund, and quartz.
43#
發(fā)表于 2025-3-29 00:26:18 | 只看該作者
44#
發(fā)表于 2025-3-29 03:54:11 | 只看該作者
https://doi.org/10.1007/978-1-4939-2471-4eaks in order to deal with the strong alterations in the peak shapes that sometimes occur. It is demonstrated that when these effects are properly accounted for and a good matrix correction program in conjunction with consistent mass absorption coefficients is used good quantitative results can be obtained.
45#
發(fā)表于 2025-3-29 10:59:38 | 只看該作者
https://doi.org/10.1007/978-3-531-90113-8sed by Sewell et al. and Pouchou and Pichoir’s model. In general, all the tested models showed similar performances. Finally the advantages of the models related to basic principles over the mathematically optimized ones are considered.
46#
發(fā)表于 2025-3-29 13:44:42 | 只看該作者
https://doi.org/10.1007/978-3-642-94443-7ctrons. In the present paper first simulations are discussed with the aim of comparing backscattered electron and secondary electron profiles of wall and trench structures. Special attention is given to the influence of the shape of the target surface topography on the electron backscattering and secondary emission.
47#
發(fā)表于 2025-3-29 16:04:57 | 只看該作者
48#
發(fā)表于 2025-3-29 19:43:46 | 只看該作者
https://doi.org/10.1007/978-3-642-94513-7d the optical properties of the lens are calculated. Preliminary results with the cathode lens in a classical SEM are presented and the new configuration in an ultra-high- vacuum (UHV) SEM is described.
49#
發(fā)表于 2025-3-30 02:36:48 | 只看該作者
Historische Versuche der Physiknfigurations the Auger image contrast varies in the magnitude and even contrast reversal is observed in the dependence on the primary energy. It even varies for the different constituents of the surface films.
50#
發(fā)表于 2025-3-30 04:38:11 | 只看該作者
https://doi.org/10.1007/978-3-663-10307-3inicyclotrons, designed for use as AMS instruments. If ionic and laser microexcitation are used in the ion source, the system would have a considerably better analytical sensitivity and isotope resolution compared to standard SIMS and LMMS techniques.
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