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Titlebook: Electron Microbeam Analysis; Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera

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發(fā)表于 2025-3-21 19:20:58 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱Electron Microbeam Analysis
編輯Abraham Boekestein (Head Department Instrumental A
視頻videohttp://file.papertrans.cn/307/306121/306121.mp4
叢書名稱Mikrochimica Acta Supplementa
圖書封面Titlebook: Electron Microbeam Analysis;  Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera
描述This supplement of Mikrochimica Acta contains selected papers from the Second Workshop of the European Microbeam Analysis Society (EMAS) "Modern Developments and Applications in Microbeam Analysis", on which took place in May 1991 in Dubrovnik (Yugoslavia). EMAS was founded in 1987 by members from almost all European countries, in order to stimulate research, applications and development of all forms of microbeam methods. One of the most important activities EMAS is the organisation of biannual workshops for demonstrating the current status and developing trends of microbeam methods. For this meeting, EMAS chose to highlight the following topics: electron-beam microanalysis (EPMA) of thin films and quantitative analysis of ultra-light elements, Auger electron spectroscopy (AES), electron energy loss spec- trometry (EELS), high-resolution transmission electron microscopy (HRTEM), quantitative analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of res
出版日期Conference proceedings 1992
關(guān)鍵詞ceramics; materials science; metals; spectroscopy; structure
版次1
doihttps://doi.org/10.1007/978-3-7091-6679-6
isbn_softcover978-3-211-82359-0
isbn_ebook978-3-7091-6679-6Series ISSN 0076-8642
issn_series 0076-8642
copyrightSpringer-Verlag Wien 1992
The information of publication is updating

書目名稱Electron Microbeam Analysis影響因子(影響力)




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書目名稱Electron Microbeam Analysis網(wǎng)絡公開度




書目名稱Electron Microbeam Analysis網(wǎng)絡公開度學科排名




書目名稱Electron Microbeam Analysis被引頻次




書目名稱Electron Microbeam Analysis被引頻次學科排名




書目名稱Electron Microbeam Analysis年度引用




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Conference proceedings 1992tive analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of res
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Maggie Andrews,N. C. Fleming,Marcus Morrisentified by HREM. Defects at or close to the interface were analyzed and a model of the atomistic arrangements of the interface in the relaxed, “perfect” regions is described with a discussion of the results.
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Quantitative X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples,itivity restrictions usually indicate microanalysis of thin section (≤ 1 μm) by energy dispersive detectors. Amongst briefly reviewed options for production of thin sections, the merits of low temperature freeze-drying, vacuum resin embedding and dry sectioning are presented, particularly for the lo
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