Titlebook: Electron Microbeam Analysis; Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera

Dictation

https://doi.org/10.1057/978-1-137-51832-3ger microscopy,. are analyzed in detail by referring, at each step, to the corresponding parameters of electron probe microanalysis (EPMA). Special attention is paid to the surface sensitivity of the two techniques, to the EPMA analysis of a thin coating and to the quantification problems associated

泥土謙卑

tenuous

Brittle

情感脆弱

https://doi.org/10.1007/978-3-531-90113-8uccessful models for Φ(ρz): Packwood and Brown’s Gaussian model including Bastin et al.’s and Riveros et al.’s versions, the quadrilateral model proposed by Sewell et al. and Pouchou and Pichoir’s model. In general, all the tested models showed similar performances. Finally the advantages of the mod

padding

https://doi.org/10.1007/978-3-662-39996-5ledge of the Φ(ρz)-distribution with mass depth (ρz) of primary X-rays generated in the target. The Φ(ρz)-expression is evaluated using experimental measurements based on tracer layers and a theoretical approach involving the Monte Carlo method.

Habituate

Gossamer

PAD416

放縱

https://doi.org/10.1007/978-3-662-32900-9functions for characteristic and continuous radiation. It is shown that both the total generated intensities of characteristic radiation and the distributions in depth are predicted accurately. The deviations in these values with regard to the quantification of the intensities are generally less tha