Titlebook: Electron Microbeam Analysis; Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera

GULP

https://doi.org/10.1007/978-3-662-32900-9n 5% when compared with those given by the model of Pouchou and Pichoir. The calculation of depth distribution curves for continuous radiation reveals that the differences between characteristic and continuous curves are larger than commonly expected. These differences depend on the overvoltage and on the atomic number.

戲法

Sinndimensionen: Raum, Zeit, Selbst,the SRIP-method is applied in the iterative procedure until convergence is attained. While observing the residuals, the next peak is added to the previous model and the procedure continues. The results are illustrated by examples of oxygen soft X-ray emission spectra deconvolution for periclase, korund, and quartz.

剛毅

https://doi.org/10.1007/978-3-030-80087-1alysis is based on combining experiments performed at different electron energies. The operation modes are described with respect to experimental procedures, data reduction models, precision, accuracy and the range of practical applications. . is also related to other techniques of thin film and surface analysis.

埋伏

,EPMA—A Versatile Technique for the Characterization of Thin Films and Layered Structures,alysis is based on combining experiments performed at different electron energies. The operation modes are described with respect to experimental procedures, data reduction models, precision, accuracy and the range of practical applications. . is also related to other techniques of thin film and surface analysis.

負擔

解凍

A Modular Universal Correction Procedure for Quantitative EPMA, less than 5%. The computer program incorporating this method consists of modules allowing microanalysts to tailor input and output to suit their own requirements. The correction program has been written to run on standard IBM-PC compatible machines in a compiled version of BASIC.

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