Titlebook: Electron Microbeam Analysis; Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera

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Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection,istic X-rays cause this effect. The critical angles of total reflection are determined for a set of X-ray lines. It is shown, that total reflection may occur with all analyzing crystals which are used in electron probe microanalysis.

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978-3-211-82359-0Springer-Verlag Wien 1992

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https://doi.org/10.1007/978-3-7091-6679-6ceramics; materials science; metals; spectroscopy; structure

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Auger Microscopy and Electron Probe Microanalysis, with the determination of the Auger backscattering factor or the Φ(0) function in EPMA..Some commonly admitted opinions are reconsidered. The main result is that, in spite of some differences, each technique may benefit from the progress established in the other technique, instead of ignoring each other.

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