Titlebook: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies; Process-Aware SRAM D Andrei Pavlov,Manoj Sachdev Book 2008 Spring

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesProcess-Aware SRAM D

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Soft Errors in SRAMs: Sources, Mechanisms and Mitigation Techniques,ole pairs to upset the storage nodes of SRAM cells. Such an upset is called a .. While such an upset can cause a data error, the device structures are not permanently damaged. If the voltage disturbance on a storage node of an SRAM cell is smaller than the noise margin of that node, the cell will co

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