Titlebook: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies; Process-Aware SRAM D Andrei Pavlov,Manoj Sachdev Book 2008 Spring

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0929-1296 l approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies..978-90-481-7855-1978-1-4020-8363-1Series ISSN 0929-1296

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Book 2008peration basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies..