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Titlebook: UV Solid-State Light Emitters and Detectors; Michael S. Shur,Artūras ?ukauskas Conference proceedings 2004 Springer Science+Business Media

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發(fā)表于 2025-3-23 12:04:42 | 只看該作者
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發(fā)表于 2025-3-23 13:59:34 | 只看該作者
Promising Results of Plasma Assisted MBE for Optoelectronic Applications,ions. However, several results suggest that PAMBE can grow high quality heterostructures on GaN templates and even directly on sapphire substrates. High quality N-face material can be probably grown on sapphire only by PAMBE. N-face GaN is grown after sapphire nitridation at low temperature and a la
13#
發(fā)表于 2025-3-23 20:42:20 | 只看該作者
Low Dislocations Density GaN/Sapphire for Optoelectronic Devices,d devices (LDs and UV-LEDs). GaN/sapphire layers have been grown by Metal Organic Vapor Phase Epitaxy (MOVPE). An amorphous silicon nitride layer is deposited using a SiH./NH. mixture prior to the growth of the low temperature GaN buffer layer. Such a process induces a 3D nucleation at the early beg
14#
發(fā)表于 2025-3-24 00:54:40 | 只看該作者
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發(fā)表于 2025-3-24 06:03:03 | 只看該作者
Materials Characterization of Group-III Nitrides under High-Power Photoexcitation,n recombination dynamics of degenerated electron—hole plasma is discussed. GaN epilayer quality characterization method based on luminescence transient studies under deep-trap saturation regime is demonstrated. Advances of application of high-density excitation for characterization of InGaN/GaN mult
16#
發(fā)表于 2025-3-24 08:31:36 | 只看該作者
Small Internal Electric Fields in Quaternary InAlGaN Heterostructures, sets of structures with different quantum well width and different Al content in the barriers (series A with 30% of Al in the barriers and series B with 60% of Al in the barriers). To determine the magnitude of the built-in electric field we employed several methods: i) theoretical estimation of pi
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發(fā)表于 2025-3-24 12:20:57 | 只看該作者
18#
發(fā)表于 2025-3-24 18:23:16 | 只看該作者
Gallium Nitride Schottky Barriers and MSM UV Detectors,perature-stable Schottky barrier contacts to GaN and AlGaN epitaxial layers was elaborated. Electrical parameters of the Schottky barriers were evaluated in a range of temperatures up to 260 °C. The Schottky barrier height, calculated from . measurements was 0.72 eV; the ideality factor value was 1.
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發(fā)表于 2025-3-24 22:44:23 | 只看該作者
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發(fā)表于 2025-3-24 23:25:21 | 只看該作者
Conference proceedings 2004state lighting has invigorated interest in white light LEDs. Ultraviolet LEDs and solar blind photodetectors represent the next frontier in solid state emitters and hold promise for many important applications in biology, medi- cine, dentistry, solid state lighting, displays, dense data storage, and
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