Titlebook: Neutron Transmutation Doping in Semiconductors; Jon M. Meese Book 1979 Plenum Press, New York 1979 Potential.circuit.computer.energy.indus

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Semiconductors held April 23-26, 1978 at the University of Missouri-Columbia. The first "testing of the waters" symposium on this subject was organized by John Cleland and Dick Wood of the Solid-State Division of Oak Ridge National Laboratory in April of 1976, just one year after NTD-silicon appeare

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978-1-4684-8251-5Plenum Press, New York 1979

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Application of NTD Silicon for Power Deviceswidened drastically in concordance with the usual price pattern of semiconductor products..The yield impact in the device industry has completely changed the projected float zone silicon consumption for at least the next five years..A survey of these phenomena is presented.

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The Minority Carrier Lifetime of Neutron Doped SiliconA study was performed to establish the minority carrier lifetime of neutron doped silicon as a function of various parameters, e.g., the resistivity, the reactor, and the starting material. It was found that lifetime was strongly dependent on resistivity and purity and weakly on starting material and reactor.

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