Titlebook: Integrated Circuit Defect-Sensitivity: Theory and Computational Models; José Pineda Gyvez Book 1993 Springer Science+Business Media New Yo

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Defect Semantics and Yield Modeling,ent high-level abstraction without considering the technology. Yet, faults have their origins in changes of the chemical and material compositions occurring in the IC. Defects have very complex physical characteristics and may be significantly different from technology to technology [15,16,92]. The

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Single vs. Multiple Layer Critical Areas,how how much error is incurred by using an SDSL model and a given layout design style. Disadvantages of SDSL models were mentioned in previous chapters and are now briefly recalled. .)The calculated critical areas account only for short/break type of faults, .) All patterns in every layer are consid

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José Pineda de Gyvezional disaster relief work.Covers the entire multidisciplinaThe 2nd edition of the Dictionary of Disaster Medicine and Humanitarian Relief is an essential and practical reference for all those who work in humanitarian relief. ?This new, expanded edition presents more than 3000 definitions and acrony

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ional disaster relief work.Covers the entire multidisciplinaThe 2nd edition of the Dictionary of Disaster Medicine and Humanitarian Relief is an essential and practical reference for all those who work in humanitarian relief. ?This new, expanded edition presents more than 3000 definitions and acrony

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Gilbert Hottoised mechanisms for achieving supply chain coordination under uncertainty, generating many fruitful analytical and empirical results. Despite the abundance of research results, there is an absence of a comprehensive reference source that provides state-of-the-art findings on both theoretical and appli