Titlebook: Chemical Bonds in Solids; Volume 3: X-Ray and N. N. Sirota Book 1972 Consultants Bureau, New York 1972 Atom.X-ray.band structure.band theo

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https://doi.org/10.1007/978-1-4302-0387-2 a comparison of . of pure silicon and chromium silicides. The semiconducting properties of chromium disilicide may be due to the presence of a partially covalent bond. A comparison of the structures of CrSi and CrSi. indicates the identity of silicon atoms in the first coordination sphere.

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https://doi.org/10.1007/978-1-4302-0387-2s obtained are used to calculate the structure amplitudes for bcc and fcc lattices. It is shown that the anisotropy of the x-ray or the electron scattering in transition metals should be observed in single-crystal and polycrystalline samples. The changes in the relative intensities in the x-ray diff

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Procedural Code and CASE Expressions,ocusing monochromators. An expression has been obtained which gives the variation in the intensity with the integrated reflection width and the size of the focus of the radiation source. Analytical conditions are presented for estimating the optimal mosaic parameters (size and disorientation angle o

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Pro T-SQL 2008 Programmer‘s Guide00) planes of gallium phosphide crystals. It was found that the potential between the nearest Ga and P atoms rose to 15.21 V along the [111] direction. The average internal potential in gallium phosphide, deduced from experimental data, was 16.02 V, whereas the value calculated from the diamagnetic

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