Titlebook: Characterization of Crystal Growth Defects by X-Ray Methods; Brian K. Tanner,D. Keith Bowen Book 1980 Springer Science+Business Media New

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https://doi.org/10.1007/978-1-4020-6627-6ith neutrons and are not discussed in this lecture. For the application of neutron diffraction techniques to the study of disordered crystals we would like to refer to a recent review article by Schmatz [1], which includes a presentation of recent results from neutron small angle scattering, and dif