Titlebook: Characterization of Crystal Growth Defects by X-Ray Methods; Brian K. Tanner,D. Keith Bowen Book 1980 Springer Science+Business Media New

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Monochromatic Synchrotron Radiation Topography,ography using laboratory generators or monochromatized synchrotron radiation topography. The purpose of the present chapter is first to produce some guide lines which will help in promoting monochromatized synchrotron radiation topography and secondly to give typical examples of applications.

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Book 1980he University of Durham, England from 29th August to 10th September 1979. The current interest in electronic materials, in particular silicon, gallium aluminium arsenide, and quartz, and the recent availability of synchrotron radiation for X-ray diffraction studies made this Advanced Study Institute

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Introduction to script.aculo.us Effectsscopy, cathodoluminescence topography and ultra-microscopy. It is when X-ray topographic results, which provide data on lattice distortions, are combined with measurements of totally different parameters that some of the most valuable insights are obtained.

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Environmental Stages and Dynamic Experiments,scopy, cathodoluminescence topography and ultra-microscopy. It is when X-ray topographic results, which provide data on lattice distortions, are combined with measurements of totally different parameters that some of the most valuable insights are obtained.

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Defect Generation in Metal Crystals,high. Those parameters sometimes are ill defined and they are dependent on one another. Besides, within the growth process must be included the initial phase of crystal generation, generally at high temperature, as well as the phase of cooling to room temperature as crystalline perfection is generally assessed at such temperature.