Titlebook: Characterization of Crystal Growth Defects by X-Ray Methods; Brian K. Tanner,D. Keith Bowen Book 1980 Springer Science+Business Media New

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Defects and Their Detectability in Melt-Grown Crystals,Indeed, one can infer much about the growth conditions from a study of defect structure. Broadly speaking, defects are introduced either during the liquid — solid phase change itself or during the subsequent change in temperature or pressure as the crystal is taken to ambient conditions.

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Defects and Their Detectability,e. Following its introduction and widespread use a large body of information has been gathered on the morphology and topology of defects. The main emphasis has been on line and planar defects and precipitates. In what follows we will confine our attention to the three major topics outlined below. (1

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Defect Visualisation: Individual Defects,n print. The topics to be included have been selected with the needs of the inexperienced worker particularly in mind. Consequently, only the simpler techniques will be discussed: the section topograph, the projection topograph, and the scanning reflection topograph. However, X-ray topographers will

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Elementary Dynamical Theory,y summaries available in the literature [1–12] though no single review covers all of the concepts which we need adequately to interpret the phenomena which are observed under the usual spherical wave conditions.

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