Titlebook: Surface and Interface Characterization by Electron Optical Methods; A. Howie,U. Valdrè Book 1988 Springer Science+Business Media New York

草本植物

Surface Microanalysis and Microscopy by X-Ray Photoelectron Spectroscopy (XPS), Core-Loss Spectrosct is considered here because this electron spectroscopy is based on a mechanism similar to that of XPS, it can be developed in parallel with AES and it allows also the surface elemental identification with an information depth in the nanometer range.

逃避責(zé)任

Emission and Low Energy Reflection Electron Microscopy,res or thickness differences: plane-view TEM). Imaging with slow electrons, on the other hand, relies either on the low escape depth of slow electrons and/or on their transmission probability through the surface.