| 書目名稱 | Surface and Interface Characterization by Electron Optical Methods | | 編輯 | A. Howie,U. Valdrè | | 視頻video | http://file.papertrans.cn/883/882351/882351.mp4 | | 叢書名稱 | Nato ASI Subseries B: | | 圖書封面 |  | | 描述 | The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident. To join the expertise of the tradi tional surface scientist with that of the electron microscopist has however been a slow and difficult process. In the past few years remarkable progress has been achieved, including the development of new techniques of scanning transmission and reflection imaging as well as low energy microscopy, all carried out in greatly improved vacuum conditions. Most astonishing of all has been the advent of the scanning tunneling electron microscope providing atomic resolution in a manner readily compatible with most surface science diagnostic procedures. The problem of beam damage, though often serious, is increasingly well understood so that we can assess the reliability and usefulness of the results which can now be obtained in catalysis studies and a wide range of surface science applications. These new developments and many others in more established surface techniques are all described in this book, based on lectures given at a NATO Advanced Study Institute held in Erice, Sicily, at | | 出版日期 | Book 1988 | | 關鍵詞 | electron; electron microscope; microscopy; spectroscopy; surface science | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4615-9537-3 | | isbn_softcover | 978-1-4615-9539-7 | | isbn_ebook | 978-1-4615-9537-3 | | copyright | Springer Science+Business Media New York 1988 |
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