Titlebook: Semiconductor Interfaces: Formation and Properties; Proceedings of the W Guy Lay,Jacques Derrien,Nino Boccara Conference proceedings 19871s

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Field Emission Microscopy for Analysis of Semiconductor Surfaces control of the surface: cleanliness, adsorption zones, degree of coverage, etc… Since field emission depends primarily on the wave functions of the electrons as they extend into vacuum, these studies can be completed with interest in a following step by Fowler-Nordheim I-V characteristics analysis.

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