| 書(shū)目名稱(chēng) | Semiconductor Interfaces: Formation and Properties |
| 副標(biāo)題 | Proceedings of the W |
| 編輯 | Guy Lay,Jacques Derrien,Nino Boccara |
| 視頻video | http://file.papertrans.cn/865/864847/864847.mp4 |
| 叢書(shū)名稱(chēng) | Springer Proceedings in Physics |
| 圖書(shū)封面 |  |
| 描述 | The trend towards miniaturisation of microelectronic devices and the search for exotic new optoelectronic devices based on multilayers confer a crucial role on semiconductor interfaces. Great advances have recently been achieved in the elaboration of new thin film materials and in the characterization of their interfacial properties, down to the atomic scale, thanks to the development of sophisticated new techniques. This book is a collection of lectures that were given at the International Winter School on Semiconductor Interfaces: Formation and Properties held at the Centre de Physique des Rouches from 24 February to 6 March, 1987. The aim of this Winter School was to present a comprehensive review of this field, in particular of the materials and methods, and to formulate recom- mendations for future research. The following topics are treated: (i) Interface formation. The key aspects of molecular beam epitaxy are emphasized, as well as the fabrication of artificially layered structures, strained layer superlattices and the tailoring of abrupt doping profiles. (ii) Fine characterization down to the atomic scale using recently devel- oped, powerful techniques such as scanning tunn |
| 出版日期 | Conference proceedings 19871st edition |
| 關(guān)鍵詞 | development; diffraction; electronic properties; microscopy; optical properties; optoelectronic devices; p |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-72967-6 |
| isbn_softcover | 978-3-642-72969-0 |
| isbn_ebook | 978-3-642-72967-6Series ISSN 0930-8989 Series E-ISSN 1867-4941 |
| issn_series | 0930-8989 |
| copyright | Springer-Verlag Berlin Heidelberg 1987 |
|Archiver|手機(jī)版|小黑屋|
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