Titlebook: Semiconductor Device Reliability; A. Christou,B. A. Unger Book 1990 Kluwer Academic Publishers 1990 ASIC.CMOS.LED.Laser.Standard.Transisto

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Considerations on the Degradation of DFB Lasers surge of DFB and FP lasers and of lasing wavelengths of 1.3 μm and 1.55 μm. These results show that DFB lasers could operate at laser output powers of 10 mW even in practical optical transmission systems.

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Statistical Models for Device Reliability; An Overviewo definitions of a device and compares and discusses several statistical models to be applied. These models encompass single as well as multiple failure mechanism cases. The models are illustrated by examples.

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InP-Based 4 × 4 Optical Switch Package Qualification and Reliabilityan 0.2 dB for all four single-mode fibers aligned with an OSA chip. To ensure mechanical stability of the tapered fibers aligned with the through-holes, mechanical strength test and temperature agings are performed, with promising results. Fundamental characteristics for a complete module are also presented.

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Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optive components, and a overview of the consolidated reliability data obtained on these components, the emphasis will be put on the resulting selection procedures that have been chosen after an optimisation and validation phase. The practical application of these procedures in supplies for the EMOS li

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