Titlebook: Scanning Probe Microscopy; The Lab on a Tip Ernst Meyer,Roland Bennewitz,Hans J. Hug Textbook 2021Latest edition The Editor(s) (if applicab

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Magnetic Force Microscopy, structure of the sample can be characterized with high lateral resolution. In addition, other scanning probe methods mapping the magnetic field at a microscopic scale and techniques providing access to atomic scale magnetism are reviewed.

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Scanning Probe Microscopy978-3-030-37089-3Series ISSN 1868-4513 Series E-ISSN 1868-4521

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Introduction to Scanning Probe Microscopy,An introduction into the field of scanning probe microscopy is given. These aspects range from the underlying concept of near-field interactions to the construction of mechanical damping systems for the experimental setup.

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Artifacts in SPM,Recurring artifacts in all modes of operation are addressed. Examples are related to the convolution with the tip geometry and the influence of piezo scanner non-linearities.

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