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Titlebook: Scanning Probe Microscopy; The Lab on a Tip Ernst Meyer,Roland Bennewitz,Hans J. Hug Textbook 2021Latest edition The Editor(s) (if applicab

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發(fā)表于 2025-3-21 16:58:07 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書(shū)目名稱(chēng)Scanning Probe Microscopy
副標(biāo)題The Lab on a Tip
編輯Ernst Meyer,Roland Bennewitz,Hans J. Hug
視頻videohttp://file.papertrans.cn/862/861164/861164.mp4
概述Explains all essential aspects of scanning probe microscopy, including STM and AFM techniques.Serves as an ideal accompaniment to courses at the graduate and advanced undergraduate levels.Presents sta
叢書(shū)名稱(chēng)Graduate Texts in Physics
圖書(shū)封面Titlebook: Scanning Probe Microscopy; The Lab on a Tip Ernst Meyer,Roland Bennewitz,Hans J. Hug Textbook 2021Latest edition The Editor(s) (if applicab
描述.Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. .This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, andtip-enhanced Raman scattering. . The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate stud
出版日期Textbook 2021Latest edition
關(guān)鍵詞Scanning Tunneling Microscopy; Atomic Force Microscopy; Magnetic Force Microscopy; Friction Force Micro
版次2
doihttps://doi.org/10.1007/978-3-030-37089-3
isbn_softcover978-3-030-37091-6
isbn_ebook978-3-030-37089-3Series ISSN 1868-4513 Series E-ISSN 1868-4521
issn_series 1868-4513
copyrightThe Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl
The information of publication is updating

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Ernst Meyer,Roland Bennewitz,Hans J. Huguch vieler, die genau das nicht wollten, fest, weil sie mit einer Unzahl von empirischen Belegen daherkam. Auf den mehr als 900 Seiten der ?feinen Unterschiede“ fehlt nichts, was man nicht schon immer gern über ?die anderen“ wissen wollte, aber auch nichts, was man sich in seinem Traum über die Würd
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Textbook 2021Latest edition multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, andtip-enhanced Raman scattering. . The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate stud
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