Titlebook: Retailing; Peter Jones,Steve Baron Textbook 1991Latest edition Peter Jones and Steve Baron 1991

只看該作者 · 發(fā)表于 2025-3-21 16:48:03

書目名稱Retailing影響因子(影響力)

書目名稱Retailing影響因子(影響力)學科排名

書目名稱Retailing網絡公開度

書目名稱Retailing網絡公開度學科排名

書目名稱Retailing被引頻次

書目名稱Retailing被引頻次學科排名

書目名稱Retailing年度引用

書目名稱Retailing年度引用學科排名

書目名稱Retailing讀者反饋

書目名稱Retailing讀者反饋學科排名

只看該作者 · 發(fā)表于 2025-3-21 22:41:49

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

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只看該作者 · 發(fā)表于 2025-3-22 08:05:19

只看該作者 · 發(fā)表于 2025-3-22 11:39:14

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

只看該作者 · 發(fā)表于 2025-3-22 13:53:30

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

只看該作者 · 發(fā)表于 2025-3-22 18:13:49

Peter Jones,Steve Baronting, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex978-1-4899-8773-0978-0-387-29409-4Series ISSN 0929-1296

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只看該作者 · 發(fā)表于 2025-3-23 02:57:32

-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex

只看該作者 · 發(fā)表于 2025-3-23 05:41:55

Peter Jones,Steve Baron-Cost Testers, Embedded Cores and System-on-Chip Testing, Memory Testing, Mixed-Signal Testing, RF Testing and Loaded Board Testing. Contributing authors are affiliated with (in alphabetical order) Agilent, ARM, Balearic Islands Univ., IBM, Inovys, Intel, LogicVision, Magma, Mentor Graphics, New Mex

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