Titlebook: Machine Learning Support for Fault Diagnosis of System-on-Chip; Patrick Girard,Shawn Blanton,Li-C. Wang Book 2023 The Editor(s) (if applic

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978-3-031-19641-6The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl

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Book 2023ilures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. Afte

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Machine Learning and Its Applications in Test,ng algorithms. Then, it explains some popular and commonly used machine learning algorithms. After that, this chapter discusses some recent machine learning-based solutions proposed to solve the VLSI testing problem. It discusses the strength and limitations of these methods. Finally, the last section concludes the chapter.

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Machine Learning in Logic Circuit Diagnosis,tegorized into three categories, namely, pre-diagnosis, during-diagnosis, and post-diagnosis to characterize when and how a given methodology enhances the classic outcomes of diagnosis that include localization, failure behavior identification, and root cause of failure.

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Machine Learning Support for Diagnosis of Analog Circuits,t simulation, diagnostic measurement extraction and selection, and the machine learning algorithms that compose the prediction system. We also demonstrate a machine learning-based diagnosis flow on an industrial case study.