Titlebook: Machine Learning Support for Fault Diagnosis of System-on-Chip; Patrick Girard,Shawn Blanton,Li-C. Wang Book 2023 The Editor(s) (if applic

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Machine Learning Support for Cell-Aware Diagnosis,r will present a ML-based cell-aware diagnosis technique. Effectiveness of existing techniques will be shown through industrial case studies and corresponding diagnosis results in terms of accuracy and resolution. The chapter will conclude by a discussion on the future directions in this field.

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Machine Learning Support for Wafer-Level Failure Pattern Analytics,very few training samples. Generative Adversarial Networks (GANs) and tensor computation based techniques are used to implement an unsupervised wafer pattern classification and recognition flow (Shan et al., IEEE International Test Conference, pp. 1–10. IEEE, 2019). In the last section, we introduce

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es can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques..978-3-031-19641-6978-3-031-19639-3

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