Titlebook: Introduction to Focused Ion Beams; Instrumentation, The Lucille A. Giannuzzi,Fred A. Stevie Book 2005 Springer-Verlag US 2005 SIMS.instrume

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Dual-Beam (FIB-SEM) Systems,advantages over a single-beam FIB system, especially for sample preparation and microscopy applications, in which the ion beam can be used for site-specific material removal and the SEM for nondestructive imaging and analysis. Dual-beam system configurations are presented, along with a number of key

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Lucille A. Giannuzzi,Brenda I. Prenitzer,Brian W. Kempshall companies.Offers a theoretical background in innovation.Thi.This monograph investigates a multitude of emerging technologies including 3D printing, 5G, blockchain, and many more to assess their potential for use to further humanity’s shared goal of sustainable development. Through case studies deta

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F. A. Stevie,D. P. Griffis,P. E. Russellave confined people at their homes which is leading them to use digital technologies such as Internet, social media, smartphones, more than ever before. The problematic use of these digital technologies may impact their mental and emotional health. This chapter discusses the role of machine learning

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