Titlebook: Introduction to Focused Ion Beams; Instrumentation, The Lucille A. Giannuzzi,Fred A. Stevie Book 2005 Springer-Verlag US 2005 SIMS.instrume

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書目名稱Introduction to Focused Ion Beams影響因子(影響力)




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Commonwealth

Ion - Solid Interactions,materials is presented. The problems of redeposition associated with an increase in sputtering yield within a confined trench are presented. Knowledge of ion - solid interactions may be used to prepare excellent quality FIB milled surfaces.

FELON

Focused Ion Beam Gases for Deposition and Enhanced Etch,d, selective material removal provides the capabilities for a much wider range of micromachining applications. This chapter introduces FIB material deposition and chemically enhanced material removal processes, lists some of the FIB chemical precursors in common use and discusses the parameters for their use, and presents several examples.

物種起源

吹牛大王

制定法律

custody

the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.978-1-4419-3574-8978-0-387-23313-0

Mindfulness

High Resolution Live Imaging of FIB Milling Processes for Optimum Accuracy,uch as energy dispersive x-ray spectroscopy (EDS), wavelength dispersive x-ray spectroscopy (WDS), secondary ion mass spectrometry (SIMS) etc. Real time high resolution SEM imaging of the cutting and deposition process enables the researcher to perform very accurate three dimensional structural examinations and device modifications.

抱怨

tattle