Titlebook: High-Resolution X-Ray Scattering; From Thin Films to L Ullrich Pietsch,Václav Holy,Tilo Baumbach Textbook 2004Latest edition Springer Scien

Malaise

1439-2674 ap- pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.978-1-4419-2307-3978-1-4757-4050-9Series ISSN 1439-2674

不能約

anachronistic

Lattice Parameters and Strains in Epitaxial Layers and Multilayersthe accuracy is high as long as one measures the lattice mismatch between the (non-deformed) substrate and the deformed layer lattice on the relative scale. In a completely lattice-matched system it is often sufficient to measure the out-of-plane lattice mismatch, partially relaxed systems require t

污點

樹木中

Diffuse Scattering From Volume Defects in Thin Layersork, we focus our description on defects in thin layers, where the relaxation at the interfaces affects the symmetry of the deformation field and consequently influences the reciprocal space distribution of scattered intensity.

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聲明

1439-2674 esult of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer

barium-study

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褲子

Scans and Resolution in Angular and Reciprocal Spacelanar. As we show later, in the non-coplanar scattering geometry (in particular, in the grazing-incidence diffraction — GID, see Sect. 4.3) the scattered intensity depends on both vectors .. and . independently.