Titlebook: High-Resolution X-Ray Scattering; From Thin Films to L Ullrich Pietsch,Václav Holy,Tilo Baumbach Textbook 2004Latest edition Springer Scien

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978-1-4419-2307-3Springer Science+Business Media New York 2004

Onerous

High-Resolution X-Ray Scattering978-1-4757-4050-9Series ISSN 1439-2674

Organization

Stress-Fracture

Dynamical TheorySo far, we have described the scattering of x-rays from thin layers using the kinematical approximation. We have neglected multiple scattering; i.e., we have neglected the influence of the scattering process on the transmitted beam.

Forage飼料

CYN

Strain Analysis in Periodic NanostructuresThe advantage of x-ray diffraction lies in its unique capability to detect the lattice deformation. This is the reason that nowadays strain analysis is one of the main applications of x-ray diffraction to epitaxial structures.

reception

GEST

Ullrich Pietsch,Václav Holy,Tilo BaumbachIncludes supplementary material:

會(huì)犯錯(cuò)誤

Advanced Texts in Physicshttp://image.papertrans.cn/h/image/426737.jpg

使增至最大

Textbook 2004Latest editionial. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.