找回密碼
 To register

QQ登錄

只需一步,快速開始

掃一掃,訪問微社區(qū)

打印 上一主題 下一主題

Titlebook: Emerging Nanotechnologies; Test, Defect Toleran Mohammad Tehranipoor Book 2008 Springer-Verlag US 2008 CMOS.Nanotechnologie.Nanotube.Techno

[復制鏈接]
樓主: Harding
41#
發(fā)表于 2025-3-28 18:10:33 | 只看該作者
Book 2008e to achieve their functionality...Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field..
42#
發(fā)表于 2025-3-28 19:51:05 | 只看該作者
The valley grassland vegetation strategy requires determining what defect rates are tolerable ., i.e., is there some level of defects beyond which constructing circuits is not practical? If we can accommodate defects, how much area overhead is required and how is it affected by choice of circuit geometry? This chapter is an empirical exploration of these questions.
43#
發(fā)表于 2025-3-29 00:40:52 | 只看該作者
Lifestyles Envisioned with Backcasting,nistic fabrication processes and dominance of quantum effects at such scale. Dealing with such high defect densities requires wide research on new test and defect tolerance techniques that they are able to provide high defect tolerance while the amount of area overhead and test/configuration time are kept reasonable.
44#
發(fā)表于 2025-3-29 03:39:11 | 只看該作者
45#
發(fā)表于 2025-3-29 10:18:44 | 只看該作者
46#
發(fā)表于 2025-3-29 12:46:07 | 只看該作者
47#
發(fā)表于 2025-3-29 16:14:16 | 只看該作者
H. Malissa,M. Grasserbauer,R. Belchere significantly different from those in electronic circuits. In fact, the 2003 International Technology Roadmap for Semiconductors (ITRS) recognizes the need for new test methods for disruptive device technologies that underly composite microsystems, and highlights it as one of the five difficult test challenges beyond 2009 [6].
48#
發(fā)表于 2025-3-29 22:48:47 | 只看該作者
Defect-Tolerant Logic with Nanoscale Crossbar Circuits strategy requires determining what defect rates are tolerable ., i.e., is there some level of defects beyond which constructing circuits is not practical? If we can accommodate defects, how much area overhead is required and how is it affected by choice of circuit geometry? This chapter is an empirical exploration of these questions.
49#
發(fā)表于 2025-3-29 23:57:08 | 只看該作者
50#
發(fā)表于 2025-3-30 07:33:28 | 只看該作者
 關于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學 Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點評 投稿經驗總結 SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學 Yale Uni. Stanford Uni.
QQ|Archiver|手機版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-5 09:06
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權所有 All rights reserved
快速回復 返回頂部 返回列表
紫阳县| 大田县| 越西县| 沙河市| 柳河县| 临沂市| 弥渡县| 福建省| 五峰| 交口县| 离岛区| 德昌县| 汾西县| 马关县| 勃利县| 蒙阴县| 金塔县| 亳州市| 阿合奇县| 连州市| 东城区| 吉水县| 宁晋县| 山西省| 赤壁市| 南昌市| 双流县| 吉木萨尔县| 广德县| 杭州市| 昭通市| 隆化县| 武陟县| 民丰县| 南投市| 凤城市| 凤台县| 忻城县| 上杭县| 浠水县| 浦北县|