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Titlebook: Emerging Nanotechnologies; Test, Defect Toleran Mohammad Tehranipoor Book 2008 Springer-Verlag US 2008 CMOS.Nanotechnologie.Nanotube.Techno

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發(fā)表于 2025-3-21 16:16:11 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
書目名稱Emerging Nanotechnologies
副標(biāo)題Test, Defect Toleran
編輯Mohammad Tehranipoor
視頻videohttp://file.papertrans.cn/309/308319/308319.mp4
概述Covers various technologies that have been suggested by researchers over the last decades.Includes technologies such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (Q
叢書名稱Frontiers in Electronic Testing
圖書封面Titlebook: Emerging Nanotechnologies; Test, Defect Toleran Mohammad Tehranipoor Book 2008 Springer-Verlag US 2008 CMOS.Nanotechnologie.Nanotube.Techno
描述.Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality...Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field..
出版日期Book 2008
關(guān)鍵詞CMOS; Nanotechnologie; Nanotube; Technologie; carbon nanotubes; circuit; design; diagnosis; logic; nanotechno
版次1
doihttps://doi.org/10.1007/978-0-387-74747-7
isbn_softcover978-1-4419-4513-6
isbn_ebook978-0-387-74747-7Series ISSN 0929-1296
issn_series 0929-1296
copyrightSpringer-Verlag US 2008
The information of publication is updating

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Built-in Self-Test and Defect Tolerance in Molecular Electronics-Based Nanofabricsoday faces a number of challenges. Quantum effects will soon make it nearly impossible to further scale devices. Deep sub-micron (DSM) technologies suffer from high leakage, and it is projected that stand-by power and active power for CMOS chips will soon become comparable [2]. Moreover, the high co
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發(fā)表于 2025-3-22 03:04:09 | 只看該作者
Test and Defect Tolerance for Reconfigurable Nanoscale Devicesulties within the next few years. In order to enhance the domain of information processing applications beyond CMOS capabilities and continue Moore‘s law, several technologies are being examined for future computing devices. Among these technologies, quantum devices, optical devices, biologically in
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A Built-In Self-Test and Diagnosis Strategy for Chemically-Assembled Electronic Nanotechnologygy between molecules, molecular-scale structures can be used to perform computational tasks. As we approach the economic and physical limits of current solid-state electronics, traditional semiconductor devices become increasingly difficult to manufacture. Advances in physics, chemistry, and biology
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QCA Circuits for Robust Coplanar Crossingaw and the International Technology Roadmap for Semiconductors (ITRS). For manufacturing, molecular QCA implementations have been proposed to allow for room temperature operation; the feature of wire crossing on the same plane (coplanar crossing) provides a significant advantage over CMOS. Coplanar
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