Titlebook: Embedded Systems: Design, Analysis and Verification; 4th IFIP TC 10 Inter Gunar Schirner,Marcelo G?tz,Franz J. Rammig Conference proceeding

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https://doi.org/10.1007/978-3-662-32848-4ncerns are arising with an alarming pace. The consequence is an increasing demand of techniques that improve yield as well as lifetime reliability of today’s complex integrated systems. It is requested though, that the solutions result in only minimum penalties on power dissipation and system perfor

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https://doi.org/10.1007/978-1-4615-0511-2g complexity of application specific instruction-set processors (ASIPs) which are inseparable parts of nowadays complex embedded systems makes this task even more challenging. In ASIPs, it is necessary to test and verify significantly bigger portion of logic, tricky timing behaviour or specific corn

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