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Titlebook: Embedded Systems: Design, Analysis and Verification; 4th IFIP TC 10 Inter Gunar Schirner,Marcelo G?tz,Franz J. Rammig Conference proceeding

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41#
發(fā)表于 2025-3-28 15:37:13 | 只看該作者
42#
發(fā)表于 2025-3-28 21:17:50 | 只看該作者
Automated Functional Verification of Application Specific Instruction-set Processors paper is to introduce an automated generation of SystemVerilog verification environments (testbenches) for verification of ASIPs. Results show that our approach reduces the time and effort needed for implementation of testbenches significantly and is robust enough to detect also well-hidden bugs.
43#
發(fā)表于 2025-3-28 23:00:57 | 只看該作者
44#
發(fā)表于 2025-3-29 03:11:25 | 只看該作者
Exploiting Segregation in Bus-Based MPSoCs to Improve Scalability of Model-Checking-Based Performancitecture. We will improve the the number of SDFAs being analyzable by our model-checking approach by exploiting the temporal and spatial segregation properties of the TDMA architecture and demonstrate how this method can be applied.
45#
發(fā)表于 2025-3-29 10:21:37 | 只看該作者
1868-4238 TC 10 International Embedded Systems Symposium, IESS 2013, held in Paderborn, Germany, in June 2013. The 22 full revised papers presented together with 8 short papers were carefully reviewed and selected from 42 submissions. The papers have been organized in the following topical sections: design me
46#
發(fā)表于 2025-3-29 14:46:43 | 只看該作者
Calibrating scanning probe microscopes,on campaign using an established benchmark suite in the embedded systems domain, we show that the careful selection of the available compiler optimizations is necessary to avoid a significant decrease of software reliability while sustaining the performance boost those optimizations provide.
47#
發(fā)表于 2025-3-29 17:41:52 | 只看該作者
48#
發(fā)表于 2025-3-29 22:41:01 | 只看該作者
49#
發(fā)表于 2025-3-30 01:23:19 | 只看該作者
50#
發(fā)表于 2025-3-30 07:12:35 | 只看該作者
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