Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,David P. Field Book 2009Latest edition Springer-Verlag

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Second-Order Microstructure Sensitive Design Using 2-Point Spatial Correlations,d in many different ways. The most common metrics of structure involve “first-order” (volume fraction) information: for example, the orientation distribution function. Such metrics serve well as the basis for property relations that do not depend significantly upon the geometrical placement of the m

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Grain Boundary Networks, orientation distribution, or crystallographic texture information, has been measured using X-ray diffraction techniques since about 1950. Consequently, the role of texture in materials performance and design is widely appreciated and commonly taught in the core Materials Science curriculum. However

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