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Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,David P. Field Book 2009Latest edition Springer-Verlag

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書目名稱Electron Backscatter Diffraction in Materials Science
編輯Adam J. Schwartz,Mukul Kumar,David P. Field
視頻videohttp://file.papertrans.cn/307/306081/306081.mp4
概述Brings together a collection of approximately 25 chapters written by experts in the field.Provides everything a researcher needs to enter and succeed in the field of electron backscatter diffraction.I
圖書封面Titlebook: Electron Backscatter Diffraction in Materials Science;  Adam J. Schwartz,Mukul Kumar,David P. Field Book 2009Latest edition Springer-Verlag
描述.Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors...The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics..
出版日期Book 2009Latest edition
關(guān)鍵詞EBSD explained; backscattered electron generation; crystallography; elastic strains; electron microscope
版次2
doihttps://doi.org/10.1007/978-0-387-88136-2
isbn_softcover978-1-4899-9334-2
isbn_ebook978-0-387-88136-2
copyrightSpringer-Verlag US 2009
The information of publication is updating

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978-1-4899-9334-2Springer-Verlag US 2009
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E. Deutsch,K. Irsigler,O. KrauppConventional EBSD-based orientation microscopy is a 2-dimensional (2D) characterization method, which is applied to plane cuts through a sample. Statistical stereological techniques can be used to gain insight into the 3D aspects of microstructure, as in, e.g., Adams (1986), Adams et al.
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Spherical Kikuchi Maps and Other Rarities,Spheres, or more accurately, spherical surfaces, are important for electron backscatter diffraction (EBSD). Electron backscatter patterns (EBSPs) and pole figure and misorientation axis data are ideally suited to display on the surface of a sphere.
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Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping inConventional EBSD-based orientation microscopy is a 2-dimensional (2D) characterization method, which is applied to plane cuts through a sample. Statistical stereological techniques can be used to gain insight into the 3D aspects of microstructure, as in, e.g., Adams (1986), Adams et al.
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Heute akquirieren - sofort profitierendividual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystals. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories
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