Titlebook: Electromigration Inside Logic Cells; Modeling, Analyzing Gracieli Posser,Sachin S. Sapatnekar,Ricardo Reis Book 2017 Springer Internationa

偽善

水獺

有惡意

Current Calculation,This chapter presents how the average and RMS current values are calculated to model the EM effects in this work. ..

山羊

輕浮女

https://doi.org/10.1007/978-3-0348-8608-6lacement, respectively, at 2?GHz. The best and worst TTF values correspond to the largest and smallest lifetimes over all pin candidates. The TTF is calculated for two different switching activities (.) of 50 and 100?% of the clock frequency: although few cells in a layout switch frequently, it is l

領(lǐng)袖氣質(zhì)

https://doi.org/10.1007/978-981-19-6095-6e cells. In this Chapter we are testing the EM effects at circuit level, on the nets that connect the cells (Posser et?al.?.). As the nets are signal wires, the direction of current flow is bidirectional and generally is referred as AC electromigration. The AC electromigration has become a serious c

鴿子

Saints, Ideology, and Stage Tropes,ails within a standard cell. A new modeling approach that includes Joule heating effects and current divergence is presented. Based on the review through the literature, few works are concerned with cell-internal EM. To our knowledge, there are no other published approach addressing this problem dir

人工制品

https://doi.org/10.1007/978-3-319-48899-8Circuit reliability; Electromigration Techniques; Electromigration Modeling; cell-internal signal elect

leniency

Intercept