Titlebook: Electromagnetic Compatibility of Integrated Circuits; Techniques for low e Sonia Ben Dhia,Mohamed Ramdani,Etienne Sicard Book 2006 Springer

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María Victoria Juárez,Xiomara Navas wealth of research results has appeared in the last couple of years, and this review aims at describing how new techniques, tools and methods have emerged. Roadmaps for integrated circuits and package, as well as EMC issues are also given in this chapter.

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,Die Rutenzugwebstühle für Plüschteppiche,le and useful theory in the EMC field. The first section deals with the basic theory of electromagnetic emission (electrical dipole, magnetic loop, near field and far field approximations), the second section then brings the concept of the Fourier transform and useful units in frequency domain. The

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https://doi.org/10.1007/978-3-663-13179-3ard methods promoted by IEC 61967 for emission, namely the TEM/GTEM, the near-field scan, the Workbench Faraday Cage and the 1/150Ω conducted methods. Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse

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https://doi.org/10.1007/978-3-662-49210-9icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.

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Die Chirurgie der Weichteile des Mundes,d circuits. Both layout level and package-related guidelines are presented. Concerning immunity, a set of defensive software techniques applicable to microcontrollers is also described. These guidelines have been applied successfully to several commercial products as well as specific test circuits.

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https://doi.org/10.1007/978-3-7091-9790-5and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.

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https://doi.org/10.1007/978-3-662-49210-9icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.

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Basic Concepts in EMC for ICs,and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.