Titlebook: Electromagnetic Compatibility of Integrated Circuits; Techniques for low e Sonia Ben Dhia,Mohamed Ramdani,Etienne Sicard Book 2006 Springer

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Measurement Methods,ard methods promoted by IEC 61967 for emission, namely the TEM/GTEM, the near-field scan, the Workbench Faraday Cage and the 1/150Ω conducted methods. Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse

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Case Studies,icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.

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Guidelines,d circuits. Both layout level and package-related guidelines are presented. Concerning immunity, a set of defensive software techniques applicable to microcontrollers is also described. These guidelines have been applied successfully to several commercial products as well as specific test circuits.

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https://doi.org/10.1007/978-3-7091-9790-5and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.