Titlebook: Electrical Characterization of Silicon-on-Insulator Materials and Devices; Sorin Cristoloveanu,Sheng S. Li Book 1995 Springer Science+Busi

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Grundlagen der doppelten Buchführung properties of SOI materials. Even after complete processing of integrated circuits, the interface quality and some of the crystalline imperfections of the incipient SOI wafer are still transparent in transistor characteristics.

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Transistor-Based Characterization Techniques, properties of SOI materials. Even after complete processing of integrated circuits, the interface quality and some of the crystalline imperfections of the incipient SOI wafer are still transparent in transistor characteristics.

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