SCIE期刊Surface Topography-Metrology and Properties 2024/2025影響因子:2.177 (SURF TOPOGR-METROL) (2051-672X). (MATERIALS SCIE

只看該作者 · 發(fā)表于 2025-3-23 12:30:16

Submitted on: 29 March 2002. Revised on: 12 April 2002. Accepted on: 27 April 2002. Surface Topography-Metrology and Properties

只看該作者 · 發(fā)表于 2025-3-23 14:59:02

Submitted on: 13 October 2004. Revised on: 22 November 2004. Accepted on: 15 December 2004. Surface Topography-Metrology and Properties

只看該作者 · 發(fā)表于 2025-3-23 18:57:45

Submitted on: 21 October 2008. Revised on: 02 November 2008. Accepted on: 28 November 2008. Surface Topography-Metrology and Properties

只看該作者 · 發(fā)表于 2025-3-24 00:02:16

Submitted on: 21 February 2008. Revised on: 27 March 2008. Accepted on: 02 April 2008. Surface Topography-Metrology and Properties

只看該作者 · 發(fā)表于 2025-3-24 02:47:18

只看該作者 · 發(fā)表于 2025-3-24 10:34:50

只看該作者 · 發(fā)表于 2025-3-24 11:08:35

Submitted on: 24 October 2002. Revised on: 14 November 2002. Accepted on: 22 November 2002. Surface Topography-Metrology and Properties

只看該作者 · 發(fā)表于 2025-3-24 18:48:16

Submitted on: 19 March 2014. Revised on: 17 April 2014. Accepted on: 24 April 2014. Surface Topography-Metrology and Properties

只看該作者 · 發(fā)表于 2025-3-24 21:43:02

只看該作者 · 發(fā)表于 2025-3-25 01:35:11

Submitted on: 02 September 2020. Revised on: 17 September 2020. Accepted on: 25 September 2020. Surface Topography-Metrology and Properties

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