Titlebook: Diffraction Analysis of the Microstructure of Materials; Eric J. Mittemeijer,Paolo Scardi Book 2004 Springer-Verlag Berlin Heidelberg 2004

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Susan Browne,Ga?tane Jean-Marier their structural investigation, two approaches for the full profile analysis of X-ray powder diffraction patterns are proposed. Use of the first one (the modified Rietveld algorithm) allows us to refine the average atomic structure parameters, including the atomic coordinates, the Debye—Waller fac

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Novea McIntosh,Rochonda L. Nenonenee improvements to existing models. For the crystallite-size modeling, we consider the size-broadened profile given by the lognormal size distribution of spherical crystallites. We derive an analytical approximation in terms of Lorentz and Gauss functions for the size-broadened profile. Its advantage

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Selfies: Putting the “Me” into Mediaof the amorphous phase, the sample is diluted with an internal standard which is considered as a component itself and refined with the other phases. Although the method is accurate for systems containing crystalline and amorphous phases with an absorption coefficient comparable to that of the standa

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Iyad Muhsen AlDajani,Martin Leinerpresented. This method will be used in certifying a nanocrystallite-size standard reference material (SRM) being developed at the National Institute of Standards and Technology (NIST). The proposed SRM will assist in ensuring that uniform procedures in quantifying the microstructure of nanocrystalli

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