| 書(shū)目名稱(chēng) | Diffraction Analysis of the Microstructure of Materials |
| 編輯 | Eric J. Mittemeijer,Paolo Scardi |
| 視頻video | http://file.papertrans.cn/279/278979/278979.mp4 |
| 概述 | The diffraction analysis is a powerful tool to characterize the microstructure, dislocations, interfaces and surfaces of microstructured materials and thin films..This book presents the method, theory |
| 叢書(shū)名稱(chēng) | Springer Series in Materials Science |
| 圖書(shū)封面 |  |
| 描述 | .Diffraction Analysis of the Microstructure of Materials. provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and?supplies readers sufficient information to apply the methods themselves. . |
| 出版日期 | Book 2004 |
| 關(guān)鍵詞 | Diffraction Analysis; Dislocation; Helium-Atom-Streuung; Interface and Surface Effects; Powder diffracti |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-662-06723-9 |
| isbn_softcover | 978-3-642-07352-6 |
| isbn_ebook | 978-3-662-06723-9Series ISSN 0933-033X Series E-ISSN 2196-2812 |
| issn_series | 0933-033X |
| copyright | Springer-Verlag Berlin Heidelberg 2004 |
|Archiver|手機(jī)版|小黑屋|
派博傳思國(guó)際
( 京公網(wǎng)安備110108008328)
GMT+8, 2026-1-27 20:47
發(fā)表于 2025-3-21 20:03:07
