Titlebook: Diffraction Analysis of the Microstructure of Materials; Eric J. Mittemeijer,Paolo Scardi Book 2004 Springer-Verlag Berlin Heidelberg 2004

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Determination of Non-uniform Dislocation Distributions in Polycrystalline Materialsation distributions occur; i.e. not all glide systems contain the same density and/or type of dislocations. The discussion is illustrated by two practical examples. It is shown that for 111 textured Al layers sputter deposited on silicon, during deformation due to a biaxial stress, predominantly scr

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Line Profile Fitting: The Case of , Crystals Containing Stacking Faultsing a general one-dimensional model. Features of the peak profiles have been found that allow the determination of the predominant type of stacking fault from an experimental XRD powder pattern with a high level of confidence. A non-monotonous change of the powder peak positions and their full width

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Determining the Dislocation Contrast Factor for X-ray Line Profile AnalysisAn important step in quantifying dislocation broadening of a line profile is the evaluation of the .. In this way the elastic properties of the material, displacement field of the dislocations and geometric orientation of the diffraction vector relative to the dislocation slip-system are incorporated into the analysis.

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Eric J. Mittemeijer,Paolo ScardiThe diffraction analysis is a powerful tool to characterize the microstructure, dislocations, interfaces and surfaces of microstructured materials and thin films..This book presents the method, theory

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https://doi.org/10.1007/978-3-662-06723-9Diffraction Analysis; Dislocation; Helium-Atom-Streuung; Interface and Surface Effects; Powder diffracti

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978-3-642-07352-6Springer-Verlag Berlin Heidelberg 2004