Titlebook: Design to Test; A Definitive Guide f Jon L. Turino Book 1990 Jon Turino 1990 ASIC.Counter.Hardware.LSI.VLSI.digital signal processor.hardwa

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LSI/VLSI Board Level Guidelines, devices per PCB is not decreasing. Rather, the number of functions per PCB is increasing in order to meet marketing and application demands. The result is that the average 100-IC PCB is far more complex. As the complexity of assemblies increases, the cost to test them increases exponentially (see Figure 5-1).

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Implementation Guidelines, sure that testability, among other things, is considered during design reviews. Your operation may already have a formal program in place. If it does, the model in this chapter may give you some suggestions for improving it. If it does not, the model that follows should give you at least a starting point in setting up your own program.

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tech- nology devices. Chapter 1 has been revised, and several examples throughout the book have been revised and updated. But some- times the more things change, the more they stay the same. All of the guidelines and information presented in this book deal with the three basic testability principles-partition978-94-011-6046-9978-94-011-6044-5

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Book 1990one several printings and become a standard in many companies, even in some countries. Both Frank and I are very proud of the success that our customers have had in utilizing the information, all of it still applicable to today‘s electronic designs. But six years is a long time in any technology fie

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