Titlebook: Design to Test; A Definitive Guide f Jon L. Turino Book 1990 Jon Turino 1990 ASIC.Counter.Hardware.LSI.VLSI.digital signal processor.hardwa

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Nature as a model for technical sensorsBuilt-in test approaches offer significant opportunities for lowering the overall cost of testing both in the factory and in the field. Built-in test features in new designs reduce system integration costs, field service costs, and printed circuit board test and repair costs while providing customers with higher system availability (uptime).

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Changing Family, Changing EducationThere are really only four general approaches to providing improved testability, three of which have already been discussed (serial, ad hoc, and probe-ability implementations). The fourth is the testability bus (T-Bus) approach.

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Lecture Notes in Computer ScienceAnother new technology that is causing testing difficulties, especially for in-circuit testers, is surface mount technology (SMT). Also sometimes called surface mounted components (SMCs) or surface mounted devices (SMDs), components in the SMT family are placed on the board rather than through the board.

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Merchant Devices on Boards,This chapter covers the control and visibility points required for testable board design using many different microprocessors and several of the most frequently used peripheral chips. After becoming familiar with these guidelines, each designer should be able to extrapolate them and choose specific guidelines for any new device or subassembly.

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Testability Busses,There are really only four general approaches to providing improved testability, three of which have already been discussed (serial, ad hoc, and probe-ability implementations). The fourth is the testability bus (T-Bus) approach.