Titlebook: Defect and Fault Tolerance in VLSI Systems; Volume 2 C. H. Stapper,V. K. Jain,G. Saucier Book 1990 Springer Science+Business Media New York

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https://doi.org/10.1007/978-981-13-0782-9ith spare rows and columns. By studying the probability of successful application of these heuristics, we are able to make statements about their average performance. Finally, an algorithm which almost always runs in polynomial time based on an appropriate failure rate is presented.

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State of Research on Devotional Fitnesses rapidly as their size decreases, not only because of the larger number of small airborne particulates but also because of the particulates from tools and semiconductor materials. Even with better clean rooms, this larger defect density can cause drastic yield reductions unless specific measures are taken to reduce its impact.

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