Titlebook: CMOS Test and Evaluation; A Physical Perspecti Manjul Bhushan,Mark B. Ketchen Book 2015 Springer Science+Business Media New York 2015 CMOS

欲望

Pantry

CMOS Metrics and Model Evaluation, device and circuit level. For a correct assessment, the integrity of compact models and EDA used tools for chip design needs to be validated over the full design window. The final verdict on the relative merits of different technologies, based on models or hardware data, can only be obtained with limited certainty.

commensurate

Variability,eir characterization are therefore important components of electrical testing. Efforts are made to maximize yield by accommodating anticipated sources of variations in chip design and by minimizing their impact with continuous improvements in the manufacturing process.

親屬

拍翅

reflection

insipid

暫停,間歇

思考才皺眉

Aswathy Jayakumar,E. K. Radhakrishnanf individual MOSFETs on CMOS chips in electrical testing is a daunting task. This task is simplified by following the hierarchical nature of chip architecture. Repetitive patterns in data transactions and in writing and reading data in memory arrays are implemented with a small subset of building bl

Chromatic