| 書目名稱 | CMOS Test and Evaluation |
| 副標(biāo)題 | A Physical Perspecti |
| 編輯 | Manjul Bhushan,Mark B. Ketchen |
| 視頻video | http://file.papertrans.cn/221/220368/220368.mp4 |
| 概述 | Relates CMOS product performance to basic physical models of transistors and passive elements.Uses embedded test structures and sensors for product test debug, yield and performance evaluation.Describ |
| 圖書封面 |  |
| 描述 | CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range. |
| 出版日期 | Book 2015 |
| 關(guān)鍵詞 | CMOS manufacturing test and quality control; CMOS microelectronic test structures; CMOS products; CMOS |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4939-1349-7 |
| isbn_softcover | 978-1-4939-4702-7 |
| isbn_ebook | 978-1-4939-1349-7 |
| copyright | Springer Science+Business Media New York 2015 |
|Archiver|手機(jī)版|小黑屋|
派博傳思國際
( 京公網(wǎng)安備110108008328)
GMT+8, 2026-1-27 09:38
發(fā)表于 2025-3-21 17:59:18
