Titlebook: Bias Temperature Instability for Devices and Circuits; Tibor Grasser Book 2014 Springer Science+Business Media New York 2014 Metastable De

FAULT

書目名稱Bias Temperature Instability for Devices and Circuits影響因子(影響力)




書目名稱Bias Temperature Instability for Devices and Circuits影響因子(影響力)學(xué)科排名




書目名稱Bias Temperature Instability for Devices and Circuits網(wǎng)絡(luò)公開(kāi)度




書目名稱Bias Temperature Instability for Devices and Circuits網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書目名稱Bias Temperature Instability for Devices and Circuits被引頻次




書目名稱Bias Temperature Instability for Devices and Circuits被引頻次學(xué)科排名




書目名稱Bias Temperature Instability for Devices and Circuits年度引用




書目名稱Bias Temperature Instability for Devices and Circuits年度引用學(xué)科排名




書目名稱Bias Temperature Instability for Devices and Circuits讀者反饋




書目名稱Bias Temperature Instability for Devices and Circuits讀者反饋學(xué)科排名

temperate

甜食

labile

https://doi.org/10.1007/978-1-349-09706-7 present a microscopic formulation of the reaction–diffusion model based on the reaction–diffusion master equation and solve it using the stochastic simulation algorithm. The calculations are compared to the macroscopic version as well as established experimental data. The degradation predicted by t

友好關(guān)系

Interim

S. Mirel,S. Pop,E. Onaca,S. Domnita,V. Mirelpendent defects. Although the kinetics of charge capture and defect creation clearly require the presence of charge carriers in the channel, they appear reaction rather than diffusion limited. While a number of peculiar features in these kinetics have been revealed recently, the most striking featur

Mangle

Book 2014as temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

keloid

Tibor GrasserEnables readers to understand and model negative bias temperature instability, with an emphasis on dynamics.Includes coverage of DC vs. AC stress, duty factor dependence and bias dependence.Explains t

Substitution

不可磨滅