Titlebook: Analytical Electron Microscopy for Materials Science; Daisuke Shindo,Tetsuo Oikawa Book 2002 Springer Japan 2002 Inelastic scattering.adva

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Analytical Electron Microscopy for Materials Science

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Analytical Electron Microscopy for Materials Science978-4-431-66988-3

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Constitution and Basic Operation of Analytical Electron Microscopes,es and diffraction patterns and for carrying out various extensive analyses, it is important to set an analytical electron microscope to be in optimal operating condition by learning the principles of its constituent units and its appropriate operating method. Here, the basic configuration of a tran

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Electron Energy-Loss Spectroscopy,troscopy (EDS). In the past, EELS was thought to be effective in compositional analysis only for light elements but useless in general for quantitative analysis in comparison with EDS. However, the accuracy of analysis by EELS is much improved recently owing to high performance of the detector and u

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Energy Dispersive X-ray Spectroscopy,is chapter. Although some improvement in the resolution of EDS has been attempted, there has been no significant modification introduced in the practice and application of EDS in comparison with electron energyloss spectroscopy (EELS). Still, this method is the most standard and reliable one in the

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