Titlebook: Analytical Electron Microscopy for Materials Science; Daisuke Shindo,Tetsuo Oikawa Book 2002 Springer Japan 2002 Inelastic scattering.adva

果仁

Electron Energy-Loss Spectroscopy,sage of a FEG. Furthermore, an energy-filter system that provides energy-filtered images has been installed on an electron microscope. Thus, currently EELS has attracted much attention for new applications such as elemental mapping and background subtraction in electron diffraction patterns.

Indebted

Book 2002of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analyt

exclamation

Book 2002of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.

固定某物

明確

Peripheral Instruments and Techniques for Analytical Electron Microscopy,ction is explained in the literature [1-3]. In this chapter we discuss the principles and application of nano-beam electron diffraction and convergent beam electron diffraction, which extensively utilize the function of an analytical electron microscope.

Mendicant

不適當(dāng)

CANE

最低點(diǎn)

VALID

Lecture Notes in Computer Sciencesage of a FEG. Furthermore, an energy-filter system that provides energy-filtered images has been installed on an electron microscope. Thus, currently EELS has attracted much attention for new applications such as elemental mapping and background subtraction in electron diffraction patterns.